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LEOI-31 Single-Wire/Single-Slit Diffraction

● Observe single-wire/single-slit diffraction
● Measure intensity distribution of diffraction  
● Confirm relationship between intensity and wavelength    
● Obtain relationship between intensity and slit width  
● Verify Heisenberg uncertainty principle and Babinet’s principle   

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LEOI-31 Single-Wire/Single-Slit Diffraction
  • LEOI-31 employs a movable digital photoreceiver to measure the intensity distribution of optical diffraction. With a focus adjustable semiconductor laser, this system can be used to
    1.observe single-wire/single-slit diffraction
    2.measure intensity distribution of optical diffraction
    3.confirm the relationship between intensity and wavelength
    4.obtain the relationship between intensity and slit width
    5.verify Heisenberg uncertainty and Babinet’s principles




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