LEOI-26B combines laser speckle photography and electronic speckle interferometry in one unit. This system can be used to measure the surface displacement field of an object from its double-exposed speckle graph. Other related parameters that can be measured using the speckle effect include strain, stress field, distance, velocity, internal defect, and internal vibration analysis. This system is developed to measure the surface displacement of an object using electronic speckle interferometry. By comparing the conventional photographic method and computer-aided electronic image processing technique, students can get a better understanding of speckle interferometry.