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LEOI-30 Diffraction Intensity Measurement System

● Stable Performance with Easy Operation
● LED Display with Accurate Reading
● Including He-Ne Laser and Photodetector with Amplifier
● Detailed Instruction Manual

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LEOI-30 Diffraction Intensity Measurement System
  • This system can be used to quantitatively investigate diffraction effects. To capture and analyze diffraction patterns, a photocell is used to transform diffraction pattern into current which is displayed by a LED. To obtain the intensity distribution of diffraction, this system allows to draw curves of the diffraction pattern with numerical data recorded. This experiment can help students understand the wave nature of light and improve their experimental skills.
    Using this system, the following experiment examples can be conducted:
    Fraunhofer Diffraction (Far-field)
    1.Fraunhofer Diffraction through a Single Slit
    2.Fraunhofer Diffraction through a Multi-Slit Plate
    3.Fraunhofer Diffraction through a Single Circular Aperture
    4.Fraunhofer Diffraction through a Transmission Grating
    Fresnel Diffraction (Near-field)
    1.Fresnel Diffraction through a Single Slit
    2.Fresnel Diffraction through a Multi-Slit Plate
    3.Fresnel Diffraction through a Circular Aperture
    4.Fresnel Diffraction past a Straight Edge




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